A Survey: Industrial Anomaly Detection based on Data Mining
DOI:
https://doi.org/10.61173/p6g5je55Keywords:
Data mining, industrial design, abnormal detection, product qualityAbstract
Industrial defect detection plays a crucial role in modern manufacturing. Identifying and addressing inferior products contributes to enhancing product quality, strengthening product competitiveness, and increasing customer satisfaction. Existing surveys of industrial defect detection are relatively scarce and struggle to reflect the latest development trends. Therefore, this article provides a more detailed and in-depth survey of industrial defect detection technologies. The article first reviews the development history of industrial defect detection methods. It then covers three aspects: the concept of general anomalies, concepts related to image anomaly detection, and industrial defects, providing an overview of industrial defect detection in these areas. It also summarizes the current state of development, as well as the advantages and disadvantages of each aspect. Additionally, the article identifies the limitations of industrial detection methods in practical industrial applications. Finally, it looks forward to the future development trends and potential research directions in this field, aiming to inspire future research.
References
innovation will be a key factor driving the development 2021, 11(16): 7657. of this field. By introducing more advanced deep learning [2] Saberironaghi A, Ren J, El-Gindy M. Defect detection methods for industrial products using deep learning techniques: Dean&Francis
A review[J]. Algorithms, 2023, 16(2): 95. applications—A survey[J]. Sensors, 2020, 20(5): 1459. [3] Gao Y, Lin J, Xie J, et al. A real-time defect detection [17] Ren Z, Fang F, Yan N, et al. State of the art in defect method for digital signal processing of industrial inspection detection based on machine vision[J]. International Journal of applications[J]. IEEE Transactions on Industrial Informatics, Precision Engineering and Manufacturing-Green Technology, 2020, 17(5): 3450-3459. 2022, 9(2): 661-691. [4] Kovásznay L S G, Joseph H M. Image processing[J]. [18] Bai X, Fang Y, Lin W, et al. Saliency-based defect
Proceedings of the IRE, 1955, 43(5): 560-570. detection in industrial images by using phase spectrum[J]. IEEE [5] Theodoridis S, Koutroumbas K. Pattern recognition[M]. Transactions on Industrial Informatics, 2014, 10(4): 2135-2145.
Elsevier, 2006. [19] Creswell A, White T, Dumoulin V, et al. Generative [6] LeCun Y, Bengio Y, Hinton G. Deep learning[J]. nature, adversarial networks: An overview[J]. IEEE signal processing 2015, 521(7553): 436-444. magazine, 2018, 35(1): 53-65. [7] Gu J, Wang Z, Kuen J, et al. Recent advances in [20] Goodfellow I, Pouget-Abadie J, Mirza M, et al. Generative
convolutional neural networks[J]. Pattern recognition, 2018, 77: adversarial networks[J]. Communications of the ACM, 2020, 354-377. 63(11): 139-144. [8] O’Shea K, Nash R. An introduction to convolutional neural [21] Weiss K, Khoshgoftaar T M, Wang D D. A survey of
networks[J]. arXiv preprint arXiv:1511.08458, 2015. transfer learning[J]. Journal of Big Data, 2016, 3(1): 1-40. [9] Ahmed M, Mahmood A N, Hu J. A survey of network [22] Zhuang F, Qi Z, Duan K, et al. A comprehensive survey on
anomaly detection techniques[J]. Journal of Network and transfer learning[J]. Proceedings of the IEEE, 2020, 109(1): 43-
Computer Applications, 2016, 60: 19-31. 76. [10] Bhuyan M H, Bhattacharyya D K, Kalita J K. Network [23] Li Y. Deep reinforcement learning: An overview[J]. arXiv anomaly detection: methods, systems, and tools[J]. Ieee preprint arXiv:1701.07274, 2017.
communications surveys & tutorials, 2013, 16(1): 303-336. [24] Arulkumaran K, Deisenroth M P, Brundage M, et al. [11] Louizos C, Swersky K, Li Y, et al. The variational fair Deep reinforcement learning: A brief survey[J]. IEEE Signal
autoencoder[J]. arXiv preprint arXiv:1511.00830, 2015. Processing Magazine, 2017, 34(6): 26-38. [12] Duran B S, Odell P L. Cluster analysis: a survey[M]. [25] Huang C C, Lin X P. Study on machine learning based
Springer Science & Business Media, 2013. intelligent defect detection system[C]//MATEC Web of [13] Zhu X J. Semi-supervised learning literature survey[J]. Conferences. EDP Sciences, 2018, 201: 01010. 2005. [26] Bertolini M, Mezzogori D, Neroni M, et al. Machine [14] Van Engelen J E, Hoos H H. A survey on semi-supervised Learning for industrial applications: A comprehensive literature
learning[J]. Machine learning, 2020, 109(2): 373-440. review[J]. Expert Systems with Applications, 2021, 175: 114820. [15] Jaiswal A, Babu A R, Zadeh M Z, et al. A survey on [27] Carmigniani J, Furht B. Augmented reality: an overview[J].
contrastive self-supervised learning[J]. Technologies, 2020, 9(1): Handbook of augmented reality, 2011: 3-46. 2. [28] Wohlgenannt I, Simons A, Stieglitz S. Virtual reality[J]. [16] Czimmermann T, Ciuti G, Milazzo M, et al. Visual-based Business & Information Systems Engineering, 2020, 62: 455- defect detection and classification approaches for industrial 461.
Downloads
Published
Issue
Section
License
Copyright (c) 2024 by the authors.

This work is licensed under a Creative Commons Attribution 4.0 International License.
