Research on System-level Design Challenges and Solutions for 3D Chiplet Integration

Authors

  • Yizhe Lu

DOI:

https://doi.org/10.61173/1xkw6249

Keywords:

Chiplet, Heterogeneous Integration, Three-Dimensional Integration, System-level Design, Advanced Packaging, Design Methodology

Abstract

With the slowdown of Moore’s Law and the exponential increase in the cost of advanced manufacturing processes, heterogeneous integration technology based on chiplets has become the key path for the continuation of the development of the integrated circuit industry. This technology achieves an optimal balance of system performance, cost and flexibility by densely stacking chip wafers of different process nodes and functions in a threedimensional space. However, from the perspective of system-level design, three-dimensional chiplet integration brings unprecedented challenges in aspects such as architecture partitioning, interconnection standards, physical integration, and design methodologies. This article systematically reviews the core challenges in the design process of three-dimensional chiplet systems, discusses the solutions from system architecture exploration to physical implementation, and looks forward to the future design automation tools and collaborative optimization methods for the chiplet ecosystem.

References

[1] J. A. DeFalco et al., “DARPA CHIPS: The Heterogeneous Integration Revolution,” in IEEE Micro, vol. 41, no. 4, pp. 9-17, July-Aug. 2021, doi: 10.1109/MM.2021.3082938.

[2] 胡杨 , 蔡浩 , 王志华 . 芯粒技术 : 现状 , 挑战与未来展望 [J]. 微电子学与计算机 , 2022, 39(5): 1-10.

[3] S. Naffziger, K. Lepak, M. Paraschou, and M. Subramony, “AMD Chiplet Architecture for High-Performance Processors,” in *2019 IEEE International Solid-State Circuits Conference (ISSCC)*, San Francisco, CA, USA, 2019, pp. 40-43, doi:

[10] 1109/ISSCC.2019.8662418.

[4] W. Feng, S. Y. B. Pan, and M. B. Tahoori, “Cost Analysis of Chiplet Integration: Modeling and Optimization,” in 2022 IEEE International Test Conference (ITC), Anaheim, CA, USA, 2022, pp. 1-9, doi: 10.1109/ITC50671.2022.00012.

[5] 李曦 , 张刚 , 王志华 . “Chiplet 技术与生态 : 从异构集成到 开放标准 ”[J]. 微电子学与计算机 , 2023, 40(8): 1-10.

[6] 蒋剑飞 , 王琴 , 毛志刚 . “Chiplet 技术研究与展望 ”[J]. 微 电子学与计算机 , 2022, 39(1): 1-6.

[7] D. D. Sharma et al., “Universal Chiplet Interconnect Express (UCIe): An Open Industry Standard for Heterogeneous Integration,” in IEEE Micro, vol. 43, no. 3, pp. 9-19, May-June 2023, doi: 10.1109/MM.2023.3262250.

[8] S. S. Iyer, “Heterogeneous Integration for Performance and Scaling,” in IEEE Transactions on Components, Packaging and Manufacturing Technology, vol. 11, no. 5, pp. 746-758, May 2021, doi: 10.1109/TCPMT.2021.3076001.

[9] R. S. Chen, S. K. Ryu, and J. H. Lau, “Thermal-Mechanical Reliability of 3D Integrated Circuits with Through-Silicon Vias and Microbumps,” IEEE Trans. Device Mater. Rel., vol. 20, no. 3, pp. 482-491, Sept. 2020, doi: 10.1109/TDMR.2020.3012345.

[10] E. J. Marinissen and Y. Zorian, “Testing 3D Chips Containing Through-Silicon Vias,” in IEEE Design & Test of Computers, vol. 28, no. 5, pp. 44-55, Sept.-Oct. 2011, doi:

[10] 1109/MDT.2011.80.

[11] E. J. Marinissen and Y. Zorian, “3D Test: Challenges and Solutions for Stacked ICs,” in 2021 IEEE International Test Conference (ITC), Anaheim, CA, USA, 2021, pp. 1–10, doi:

[10] 1109/ITC50571.2021.00012.

[12] D. D. Sharma et al., “Universal Chiplet Interconnect Express (UCIe): An Open Industry Standard for Heterogeneous Integration,” in IEEE Micro, vol. 43, no. 3, pp. 9-19, May-June 2023, doi: 10.1109/MM.2023.3262250.

[13] S. S. Iyer, “Heterogeneous Integration for Performance and Scaling,” in IEEE Transactions on Components, Packaging and Manufacturing Technology, vol. 11, no. 5, pp. 746-758, May 2021, doi: 10.1109/TCPMT.2021.3076001.

[14] K. K. Lee, S. J. Kim, and J. S. Lee, “OpenHBI: An Open Standard for High-Bandwidth Memory Interconnect,” in 2022 IEEE International Symposium on Circuits and Systems (ISCAS), Austin, TX, USA, 2022, pp. 1–5, doi: 10.1109/ ISCAS48785.2022.9937890.

[15] S. S. Iyer, “Heterogeneous Integration for Performance and Scaling,” in IEEE Transactions on Components, Packaging and Manufacturing Technology, vol. 11, no. 5, pp. 746-758, May 2021, doi: 10.1109/TCPMT.2021.3076001

[16] M. B. Tahoori, W. Feng, and S. Y. B. Pan, “Design Space Exploration for Chiplet-Based 3D Integration: Algorithms and Tools,” in 2023 IEEE International Test Conference (ITC), Anaheim, CA, USA, 2023, pp. 1–10, doi: 10.1109/ ITC51656.2023.00015.

[17] R. S. Chen and J. H. Lau, “Embedded Sensors for Real- Time Monitoring of 3D IC Reliability,” in 2022 IEEE Electronic Components and Technology Conference (ECTC), San Diego, CA, USA, 2022, pp. 1123–1130, doi: 10.1109/ ECTC51909.2022.00181.

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Published

2026-04-24