SHEN, Yuchao. Chip Appearance Inspection Using Machine Learning Techniques. Science and Technology of Engineering, Chemistry and Environmental Protection, [S. l.], v. 2, n. 5, p. 3892, 2024. DOI: 10.61173/96ajbn41. Disponível em: https://stecep.deanfrancis.press/article/view/1596. Acesso em: 4 nov. 2026.