LIU, Yuting. Research on the mechanism of dynamic avalanche induced by IGBT short circuit and its influencing factors. Science and Technology of Engineering, Chemistry and Environmental Protection, [S. l.], v. 2, n. 3, p. 1402, 2024. DOI: 10.61173/efjknq86. Disponível em: https://stecep.deanfrancis.press/article/view/1715. Acesso em: 4 nov. 2026.