XIANG, Junli. Research on Latch-up effect suppression method of IC based on CMOS technology. Science and Technology of Engineering, Chemistry and Environmental Protection, [S. l.], v. 2, n. 3, p. 1702, 2024. DOI: 10.61173/av9efx49. Disponível em: https://stecep.deanfrancis.press/article/view/1745. Acesso em: 4 nov. 2026.