SUN, Shangwei; HUANG, Wutong. AI-Based Analysis of Yield Losses and Defect Detection in Semiconductor Manufacturing. Science and Technology of Engineering, Chemistry and Environmental Protection, [S. l.], v. 4, n. 1, p. 14512, 2026. DOI: 10.61173/b1x04v83. Disponível em: https://stecep.deanfrancis.press/article/view/324. Acesso em: 4 nov. 2026.