KOU, Feiyang. Op-Amp’s Application in SiC MOSFETs as a Short-Circuit Detector. Science and Technology of Engineering, Chemistry and Environmental Protection, [S. l.], v. 3, n. 6, p. 14142, 2025. DOI: 10.61173/n9rfn113. Disponível em: https://stecep.deanfrancis.press/article/view/553. Acesso em: 4 nov. 2026.