ZHANG, Chengwei. A Review of the Synergistic Research on Materials, Physics, and Reliability of Wide Bandgap Semiconductor (SiC/GaN) Power Devices. Science and Technology of Engineering, Chemistry and Environmental Protection, [S. l.], v. 3, n. 5, p. 11622, 2025. DOI: 10.61173/p82rj010. Disponível em: https://stecep.deanfrancis.press/article/view/634. Acesso em: 4 nov. 2026.