HUANG, Zhongxu. The Advancements of Fault Detection in Microelectronics Based on Machine Learning Models. Science and Technology of Engineering, Chemistry and Environmental Protection, [S. l.], v. 3, n. 4, p. 10492, 2025. DOI: 10.61173/ns4wqe91. Disponível em: https://stecep.deanfrancis.press/article/view/814. Acesso em: 4 nov. 2026.